Tutorial test generation for VLSI chips

Tutorial test generation for VLSI chips

Detalhes bibliográficos
Autor Corporativo: IEEE Computer Society
Outros Autores: Agrawal, Vishwani D. 1943-, Seth, Sharad C.
Formato: Livro
Idioma:English
Publicado em: Washington, D.C., Los Angeles, CA Computer Society Press Order from Computer Society c1988.
Assuntos:
Integrated circuits > Very large scale integration > Testing.
Automatic test equipment.