Tutorial test generation for VLSI chips

Tutorial test generation for VLSI chips

Bibliografische gegevens
Coauteur: IEEE Computer Society
Andere auteurs: Agrawal, Vishwani D. 1943-, Seth, Sharad C.
Formaat: Boek
Taal:English
Gepubliceerd in: Washington, D.C., Los Angeles, CA Computer Society Press Order from Computer Society c1988.
Onderwerpen:
Integrated circuits > Very large scale integration > Testing.
Automatic test equipment.