Tutorial test generation for VLSI chips

Tutorial test generation for VLSI chips

書目詳細資料
企業作者: IEEE Computer Society
其他作者: Agrawal, Vishwani D. 1943-, Seth, Sharad C.
格式: 圖書
語言:English
出版: Washington, D.C., Los Angeles, CA Computer Society Press Order from Computer Society c1988.
主題:
Integrated circuits > Very large scale integration > Testing.
Automatic test equipment.