Tutorial test generation for VLSI chips

Bibliographic Details
Corporate Author:	IEEE Computer Society
Other Authors:	Agrawal, Vishwani D. 1943-, Seth, Sharad C.
Format:	Book
Language:	English
Published:	Washington, D.C., Los Angeles, CA Computer Society Press Order from Computer Society c1988.
Subjects:	Integrated circuits > Very large scale integration > Testing. Automatic test equipment.