Tutorial test generation for VLSI chips

Tutorial test generation for VLSI chips

Bibliografske podrobnosti
Korporativna značnica: IEEE Computer Society
Drugi avtorji: Agrawal, Vishwani D. 1943-, Seth, Sharad C.
Format: Knjiga
Jezik:English
Izdano: Washington, D.C., Los Angeles, CA Computer Society Press Order from Computer Society c1988.
Teme:
Integrated circuits > Very large scale integration > Testing.
Automatic test equipment.