Tutorial test generation for VLSI chips

Tutorial test generation for VLSI chips

Detalles Bibliográficos
Autor Corporativo: IEEE Computer Society
Otros Autores: Agrawal, Vishwani D. 1943-, Seth, Sharad C.
Formato: Libro
Lenguaje:English
Publicado: Washington, D.C., Los Angeles, CA Computer Society Press Order from Computer Society c1988.
Materias:
Integrated circuits > Very large scale integration > Testing.
Automatic test equipment.