Tutorial test generation for VLSI chips

Tutorial test generation for VLSI chips

Bibliografiske detaljer
Institution som forfatter: IEEE Computer Society
Andre forfattere: Agrawal, Vishwani D. 1943-, Seth, Sharad C.
Format: Bog
Sprog:English
Udgivet: Washington, D.C., Los Angeles, CA Computer Society Press Order from Computer Society c1988.
Fag:
Integrated circuits > Very large scale integration > Testing.
Automatic test equipment.