Tutorial test generation for VLSI chips

Tutorial test generation for VLSI chips

Dades bibliogràfiques
Autor corporatiu: IEEE Computer Society
Altres autors: Agrawal, Vishwani D. 1943-, Seth, Sharad C.
Format: Llibre
Idioma:English
Publicat: Washington, D.C., Los Angeles, CA Computer Society Press Order from Computer Society c1988.
Matèries:
Integrated circuits > Very large scale integration > Testing.
Automatic test equipment.