APA ציטוט

IEEE Computer Society, Agrawal, V. D., & Seth, S. C. (1988). Tutorial test generation for VLSI chips. Computer Society Press Order from Computer Society.

Chicago Style (17th ed.) Citation

IEEE Computer Society, Vishwani D. Agrawal, and Sharad C. Seth. Tutorial Test Generation for VLSI Chips. Washington, D.C., Los Angeles, CA: Computer Society Press Order from Computer Society, 1988.

ציטוט MLA

IEEE Computer Society, et al. Tutorial Test Generation for VLSI Chips. Computer Society Press Order from Computer Society, 1988.