APA-viite (7. p.)

IEEE Computer Society, Agrawal, V. D., & Seth, S. C. (1988). Tutorial test generation for VLSI chips. Computer Society Press Order from Computer Society.

Chicago-viite (17. p.)

IEEE Computer Society, Vishwani D. Agrawal, ja Sharad C. Seth. Tutorial Test Generation for VLSI Chips. Washington, D.C., Los Angeles, CA: Computer Society Press Order from Computer Society, 1988.

MLA-viite (9. p.)

IEEE Computer Society, et al. Tutorial Test Generation for VLSI Chips. Computer Society Press Order from Computer Society, 1988.