Cita APA (7a ed.)

IEEE Computer Society, Agrawal, V. D., & Seth, S. C. (1988). Tutorial test generation for VLSI chips. Computer Society Press Order from Computer Society.

Cita Chicago Style (17a ed.)

IEEE Computer Society, Vishwani D. Agrawal, y Sharad C. Seth. Tutorial Test Generation for VLSI Chips. Washington, D.C., Los Angeles, CA: Computer Society Press Order from Computer Society, 1988.

Cita MLA (9a ed.)

IEEE Computer Society, et al. Tutorial Test Generation for VLSI Chips. Computer Society Press Order from Computer Society, 1988.