Logic testing and design for testability

Logic testing and design for testability

Bibliografske podrobnosti
Glavni avtor: Fujiwara, Hideo (Author)
Format: Electronic Resource
Jezik:English
Izdano: Cambridge, Massachusetts The MIT Press [1985]
Teme:
Logic circuits > Testing.
Electronic books.
Online dostop:https://ieeexplore-ieee-org.ezproxy.engglib.upd.edu.ph/book/6267264
https://ieeexplore.ieee.org/book/6267264