Design for testability, debug and reliability next generation measures using formal techniques

Design for testability, debug and reliability next generation measures using formal techniques

This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the rising challenges in the field of design for testabi...

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Detalhes bibliográficos
Main Authors: Huhn, Sebastian (Author), Drechsler, Rolf (Author)
Formato: Electronic Resource
Idioma:English
Publicado em: Switzerland Springer [2021]
Assuntos:
Integrated circuits > Design and construction.
Integrated circuits > Reliability.
Integrated circuits > Testing.
Debugging in computer science.
Electronic books.
Acesso em linha:https://link-springer-com.ezproxy.engglib.upd.edu.ph/book/10.1007/978-3-030-69209-4
https://doi.org/10.1007/978-3-030-69209-4