Design for testability, debug and reliability next generation measures using formal techniques

This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the rising challenges in the field of design for testabi...

詳細記述

書誌詳細

主要な著者:	Huhn, Sebastian (著者), Drechsler, Rolf (著者)
フォーマット:	Electronic Resource
言語:	English
出版事項:	Switzerland Springer [2021]
主題:	Integrated circuits > Design and construction. Integrated circuits > Reliability. Integrated circuits > Testing. Debugging in computer science. Electronic books.
オンライン･アクセス:	https://link-springer-com.ezproxy.engglib.upd.edu.ph/book/10.1007/978-3-030-69209-4 https://doi.org/10.1007/978-3-030-69209-4