Design for testability, debug and reliability next generation measures using formal techniques

This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the rising challenges in the field of design for testabi...

وصف كامل

التفاصيل البيبلوغرافية

المؤلفون الرئيسيون:	Huhn, Sebastian (مؤلف), Drechsler, Rolf (مؤلف)
التنسيق:	Electronic Resource
اللغة:	English
منشور في:	Switzerland Springer [2021]
الموضوعات:	Integrated circuits > Design and construction. Integrated circuits > Reliability. Integrated circuits > Testing. Debugging in computer science. Electronic books.
الوصول للمادة أونلاين:	https://link-springer-com.ezproxy.engglib.upd.edu.ph/book/10.1007/978-3-030-69209-4 https://doi.org/10.1007/978-3-030-69209-4