Zimpeck, A., Meinhardt, C., Artola, L., & Reis, R. (2021). Mitigating process variability and soft errors at circuit-level for FinFETs. Springer. https://doi.org/10.1007/978-3-030-68368-9
Citace podle Chicago (17th ed.)Zimpeck, Alexandra, Cristina Meinhardt, Laurent Artola, a Ricardo Reis. Mitigating Process Variability and Soft Errors at Circuit-level for FinFETs. Switzerland: Springer, 2021. https://doi.org/10.1007/978-3-030-68368-9.
Citace podle MLA (9th ed.)Zimpeck, Alexandra, et al. Mitigating Process Variability and Soft Errors at Circuit-level for FinFETs. Springer, 2021. https://doi.org/10.1007/978-3-030-68368-9.
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