Mitigating process variability and soft errors at circuit-level for FinFETs

This book evaluates the influence of process variations (e.g. work-function fluctuations) and radiation-induced soft errors in a set of logic cells using FinFET technology, considering the 7nm technological node as a case study. Moreover, for accurate soft error estimation, the authors adopt a radia...

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Detalhes bibliográficos

Main Authors:	Zimpeck, Alexandra (Author), Meinhardt, Cristina (Author), Artola, Laurent (Author), Reis, Ricardo (Author)
Formato:	Electronic Resource
Idioma:	English
Publicado em:	Switzerland Springer [2021]
Assuntos:	Field-effect transistors > Design and construction. Field-effect transistors > Reliability. Soft errors (Computer science)
Acesso em linha:	Also available remotely for the University of the Philippines System via SpringerLink. Click here to access thru EZproxy Available for University of the Philippines System via SpringerLink. Click here to access