Soft error reliability of VLSI circuits analysis and mitigation techniques

Detalles Bibliográficos
Autores principales:	Ghavami, Behnam (Autor), Raji, Mohsen (Autor)
Formato:	Electronic Resource
Lenguaje:	English
Publicado:	Switzerland Springer [2021]
Materias:	Integrated circuits > Very large scale integration > Reliability. Electronic circuits.
Acceso en línea:	Also available remotely for the University of the Philippines System via SpringerLink. Click here to acess thru EZproxy Available for University of the Philippines System via SpringerLink. Click here to access