Soft error reliability of VLSI circuits analysis and mitigation techniques

Detalhes bibliográficos
Main Authors:	Ghavami, Behnam (Author), Raji, Mohsen (Author)
Formato:	Electronic Resource
Idioma:	English
Publicado em:	Switzerland Springer [2021]
Assuntos:	Integrated circuits > Very large scale integration > Reliability. Electronic circuits.
Acesso em linha:	Also available remotely for the University of the Philippines System via SpringerLink. Click here to acess thru EZproxy Available for University of the Philippines System via SpringerLink. Click here to access