Soft error reliability of VLSI circuits analysis and mitigation techniques

מידע ביבליוגרפי
Main Authors:	Ghavami, Behnam (Author), Raji, Mohsen (Author)
פורמט:	Electronic Resource
שפה:	English
יצא לאור:	Switzerland Springer [2021]
נושאים:	Integrated circuits > Very large scale integration > Reliability. Electronic circuits.
גישה מקוונת:	Also available remotely for the University of the Philippines System via SpringerLink. Click here to acess thru EZproxy Available for University of the Philippines System via SpringerLink. Click here to access