Soft error reliability of VLSI circuits analysis and mitigation techniques

Bibliografiska uppgifter
Huvudupphovsmän:	Ghavami, Behnam (Författare, medförfattare), Raji, Mohsen (Författare, medförfattare)
Materialtyp:	Electronic Resource
Språk:	English
Publicerad:	Switzerland Springer [2021]
Ämnen:	Integrated circuits > Very large scale integration > Reliability. Electronic circuits.
Länkar:	Also available remotely for the University of the Philippines System via SpringerLink. Click here to acess thru EZproxy Available for University of the Philippines System via SpringerLink. Click here to access