Soft error reliability of VLSI circuits analysis and mitigation techniques

Dettagli Bibliografici
Autori principali:	Ghavami, Behnam (Autore), Raji, Mohsen (Autore)
Natura:	Electronic Resource
Lingua:	English
Pubblicazione:	Switzerland Springer [2021]
Soggetti:	Integrated circuits > Very large scale integration > Reliability. Electronic circuits.
Accesso online:	Also available remotely for the University of the Philippines System via SpringerLink. Click here to acess thru EZproxy Available for University of the Philippines System via SpringerLink. Click here to access