Soft error reliability of VLSI circuits analysis and mitigation techniques

Bibliographic Details
Main Authors:	Ghavami, Behnam (Author), Raji, Mohsen (Author)
Format:	Electronic Resource
Language:	English
Published:	Switzerland Springer [2021]
Subjects:	Integrated circuits > Very large scale integration > Reliability. Electronic circuits.
Online Access:	Also available remotely for the University of the Philippines System via SpringerLink. Click here to acess thru EZproxy Available for University of the Philippines System via SpringerLink. Click here to access