Dyfyniad APA

Ghavami, B., & Raji, M. (2021). Soft error reliability of VLSI circuits: Analysis and mitigation techniques. Springer. https://doi.org/10.1007/978-3-030-51610-9

Dyfyniad Arddull Chicago

Ghavami, Behnam, and Mohsen Raji. Soft Error Reliability of VLSI Circuits: Analysis and Mitigation Techniques. Switzerland: Springer, 2021. https://doi.org/10.1007/978-3-030-51610-9.

Dyfyniad MLA

Ghavami, Behnam, and Mohsen Raji. Soft Error Reliability of VLSI Circuits: Analysis and Mitigation Techniques. Springer, 2021. https://doi.org/10.1007/978-3-030-51610-9.

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