APA (7e ed.) Bronvermelding

Ghavami, B., & Raji, M. (2021). Soft error reliability of VLSI circuits: Analysis and mitigation techniques. Springer. https://doi.org/10.1007/978-3-030-51610-9

Chicago (17e ed.) Bronvermelding

Ghavami, Behnam, en Mohsen Raji. Soft Error Reliability of VLSI Circuits: Analysis and Mitigation Techniques. Switzerland: Springer, 2021. https://doi.org/10.1007/978-3-030-51610-9.

MLA (9e ed.) Bronvermelding

Ghavami, Behnam, en Mohsen Raji. Soft Error Reliability of VLSI Circuits: Analysis and Mitigation Techniques. Springer, 2021. https://doi.org/10.1007/978-3-030-51610-9.