Fundamentals of modern VLSI devices

Detalhes bibliográficos
Main Authors:	Taur, Yuan (Author), Ning, Tak H. (Author)
Formato:	Electronic Resource
Idioma:	English
Publicado em:	Cambridge Cambridge University Press [2021]
Assuntos:	Metal oxide semiconductors, Complementary. Bipolar transistors. Integrated circuits > Very large scale integration.
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