Tree measurement using photograph from an ordinary digital camera and mapping of trees using line offset survey technique

Bibliographic Details
Published in:USM R & D Journal Vol. 18, no. 1 (Jan. 2010 - Jun. 2010), 95-100
Main Author: Vallesteros, Shierel F.
Other Authors: Bantayan, Nathaniel C., Vallesteros, Arvin P.
Format: Article
Language:English
Published: 2010
Subjects: