Influence of stacked Ge Islands on the dark current-voltage characteristics of a diode for solar cell application

We report on the dark current-voltage (I-V) characteristics of a diode with embedded stacked Ge islands in the intrinsic layer for solar cell application. Gas-source molecular beam epitaxy was used to grow the stacked Ge islands on Si substrate. Two-diode model was utilized to analyze the dark I-V c...

詳細記述

書誌詳細
出版年:Transactions of the National Academy of Science and Technology Vol. 33, no. 1 (Jul. 2011), 180
第一著者: Alguno, Arnold C.
その他の著者: Kirit, Noli Vergel E., Codizar, Jihan D., Dagaerag, Liza-Fe L.
フォーマット: 論文
言語:English
出版事項: 2011
主題: