Influence of stacked Ge Islands on the dark current-voltage characteristics of a diode for solar cell application

We report on the dark current-voltage (I-V) characteristics of a diode with embedded stacked Ge islands in the intrinsic layer for solar cell application. Gas-source molecular beam epitaxy was used to grow the stacked Ge islands on Si substrate. Two-diode model was utilized to analyze the dark I-V c...

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Bibliografiske detaljer
Udgivet i:Transactions of the National Academy of Science and Technology Vol. 33, no. 1 (Jul. 2011), 180
Hovedforfatter: Alguno, Arnold C.
Andre forfattere: Kirit, Noli Vergel E., Codizar, Jihan D., Dagaerag, Liza-Fe L.
Format: Article
Sprog:English
Udgivet: 2011
Fag: