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Parametric and Kinetic Study of Silicon Nitride Film Deposition on Silicon Wafer by Low Pressure Chemical Vapor Deposition (LPCVD) Method.
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Parametric and kinetic study of silicon nitride film deposition on silicon wafer by Low Pressure Chemical Vapor Deposition (LPCVD) method
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Velasco, Angelito A.
Published in
Philippine Engineering Journal
(2002)
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CAMPUS
Diliman
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DATABASE
Index to Philippine Periodicals (IPP)
UNIT LIBRARY
Diliman Main Library: Serials Section
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SUBJECT
Analysis of variance
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Chemical vapor deposition
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Silicon nitride
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AUTHOR
Velasco, Angelito A.
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RESOURCE TYPE
Article
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LANGUAGE
English
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