Showing 51 - 60 results of 108 for search 'IEEE Transactions on electron devices', query time: 0.03s Refine Results
  1. 51

    Total dose and displacement damage effects in a radiation-hardened CMOS APS. by Bogaerts, J.

    Article

    Total dose and displacement damage effects in a radiation-hardened CMOS APS.
  2. 52

    A CMOS image sensor with dark-current cancellation and dynamic sensitivity operations. by Hsiu-Yu Cheng

    Article

    A CMOS image sensor with dark-current cancellation and dynamic sensitivity operations.
  3. 53

    Transversal-readout architecture for CMOS active pixel image sensors. by Miyatake, S.

    Article

    Transversal-readout architecture for CMOS active pixel image sensors.
  4. 54

    A high-speed, 240-frames by Krymski, A.I

    Article

    A high-speed, 240-frames
  5. 55

    A 9-V/Lux-s 5000-frames by Krymski, A.I

    Article

    A 9-V/Lux-s 5000-frames
  6. 56

    An image sensor which captures 100 consecutive frames at 1000000 frames by Etoh, T.G

    Article

    An image sensor which captures 100 consecutive frames at 1000000 frames
  7. 57

    A CMOS image sensor for high-speed active range finding using column-parallel time-domain ADC and position encoder. by Oike, Y.

    Article

    A CMOS image sensor for high-speed active range finding using column-parallel time-domain ADC and position encoder.
  8. 58

    An APS with 2-D winner-take-all selection employing adaptive spatial filtering and false alarm reduction. by Fish, A.

    Article

    An APS with 2-D winner-take-all selection employing adaptive spatial filtering and false alarm reduction.
  9. 59

    Excess noise and other important characteristics of low light level imaging using charge multiplying CCDs. by Hynecek, J.

    Article

    Excess noise and other important characteristics of low light level imaging using charge multiplying CCDs.
  10. 60

    An experimental study of charge diffusion in the undepleted silicon of X-ray CCDs. by Prigozhin, G.

    Article

    An experimental study of charge diffusion in the undepleted silicon of X-ray CCDs.

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