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Design of wireless on-wafer submicron characterization system.
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Moore, B.
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IEEE Transactions on VLSI systems
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Petri-net and GA-based approach to modeling, scheduling, and performance evaluation for wafer fabrication.
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Jyh-Horn Chen
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IEEE Transactions on robotics and automation
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DATABASE
Union Catalog (Buklod)
2 results
2
AUTHOR
Jyh-Horn Chen
1 results
1
Moore, B.
1 results
1
RESOURCE TYPE
Article
2 results
2
LANGUAGE
English
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