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An electromigration and thermal model of power wires for a priori high-level reliability prediction.
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Casu, M.R
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IEEE Transactions on VLSI systems
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Statistical analysis of subthreshold leakage current for VLSI circuits.
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Leakage current reduction in CMOS VLSI circuits by input vector control.
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Gate oxide leakage current analysis and reduction for VLSI circuits.
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Dongwoo Lee
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LECTOR a technique for leakage reduction in CMOS circuits.
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Hanchate, N.
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High-performance VLSI architecture of adaptive decision feedback equalizer based on predictive parallel branch slicer (PPBS) scheme.
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Efficient reconfigurable techniques for VLSI arrays with 6-port switches.
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DATABASE
Union Catalog (Buklod)
77 results
77
AUTHOR
Hellemans, A.
3 results
3
Mohanty, S.P
2 results
2
Xinmiao Zhang
2 results
2
Abdollahi, A.
1 results
1
Abou-Seido, A.I
1 results
1
Ahmed, E.
1 results
1
Alpert, C.J
1 results
1
Bachmann, W.W
1 results
1
Bhanja, S.
1 results
1
Blotti, A.
1 results
1
Bux, W.
1 results
1
Carrillo, J.M
1 results
1
Casu, M.R
1 results
1
Chandramouli, R.
1 results
1
Chang Hoon Kim
1 results
1
Chaturvedi, R.
1 results
1
Chien-Ming Wu
1 results
1
Chou, E.Y
1 results
1
Dambre, J.
1 results
1
Deodhar, V.V
1 results
1
Dinh, A.
1 results
1
Dobkin, R.
1 results
1
Dongwoo Lee
1 results
1
Dwyer, C.
1 results
1
Fanucci, L.
1 results
1
Fei Sun
1 results
1
Fischer, V.
1 results
1
Fish, A.
1 results
1
Frenkil, J.
1 results
1
Haj Ali Asgari, F.
1 results
1
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RESOURCE TYPE
Article
77 results
77
LANGUAGE
English
77 results
77
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