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Leakage current reduction in CMOS VLSI circuits by input vector control.
由
Abdollahi, A.
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IEEE Transactions on VLSI systems
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Gate oxide leakage current analysis and reduction for VLSI circuits.
由
Dongwoo Lee
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IEEE Transactions on VLSI systems
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DATABASE
Union Catalog (Buklod)
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AUTHOR
Abdollahi, A.
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Bachmann, W.W
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Bhanja, S.
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Dambre, J.
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Dongwoo Lee
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Dwyer, C.
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Maheshwari, A.
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Moore, B.
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Pomeranz, I.
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Rao, R.
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Seongkyun Shin
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Sikdar, B.K
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