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Leakage current reduction in CMOS VLSI circuits by input vector control.
by
Abdollahi, A.
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IEEE Transactions on VLSI systems
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Gate oxide leakage current analysis and reduction for VLSI circuits.
by
Dongwoo Lee
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IEEE Transactions on VLSI systems
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DATABASE
Union Catalog (Buklod)
12 results
12
AUTHOR
Abdollahi, A.
1 results
1
Bachmann, W.W
1 results
1
Bhanja, S.
1 results
1
Dambre, J.
1 results
1
Dongwoo Lee
1 results
1
Dwyer, C.
1 results
1
Maheshwari, A.
1 results
1
Moore, B.
1 results
1
Pomeranz, I.
1 results
1
Rao, R.
1 results
1
Seongkyun Shin
1 results
1
Sikdar, B.K
1 results
1
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RESOURCE TYPE
Article
12 results
12
LANGUAGE
English
12 results
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