Showing 2,201 - 2,210 results of 2,340 for search '"The Circuit."', זמן שאילתה: 0.02s Refine Results
  1. 2201

    The Hunt For The Kill Switch. מאת Adee, S.

    הוצא לאור ב IEEE spectrum
    Article

    The Hunt For The Kill Switch.
  2. 2202

    Fast comparisons of circuit implementations. מאת Karandikar, S.K

    הוצא לאור ב IEEE Transactions on VLSI systems
    Article

    Fast comparisons of circuit implementations.
  3. 2203

    Wire retiming as fixpoint computation. מאת Chuan Lin

    הוצא לאור ב IEEE Transactions on VLSI systems
    Article

    Wire retiming as fixpoint computation.
  4. 2204

    Gate oxide leakage and delay tradeoffs for dual-Tox circuits. מאת Sultania, A.K

    הוצא לאור ב IEEE Transactions on VLSI systems
    Article

    Gate oxide leakage and delay tradeoffs for dual-Tox circuits.
  5. 2205

    Bus encoding for total power reduction using a leakage-aware buffer configuration. מאת Rao, R.R

    הוצא לאור ב IEEE Transactions on VLSI systems
    Article

    Bus encoding for total power reduction using a leakage-aware buffer configuration.
  6. 2206

    Test pattern generation and partial-scan methodology for an asynchronous SoC interconnect. מאת Efthymiou, A.

    הוצא לאור ב IEEE Transactions on VLSI systems
    Article

    Test pattern generation and partial-scan methodology for an asynchronous SoC interconnect.
  7. 2207

    The limit of dynamic voltage scaling and insomniac dynamic voltage scaling. מאת Bo Zhai

    הוצא לאור ב IEEE Transactions on VLSI systems
    Article

    The limit of dynamic voltage scaling and insomniac dynamic voltage scaling.
  8. 2208

    A novel high-speed sense-amplifier-based flip-flop. מאת Strollo, A.G.M

    הוצא לאור ב IEEE Transactions on VLSI systems
    Article

    A novel high-speed sense-amplifier-based flip-flop.
  9. 2209

    Efficient testing of SRAM with optimized march sequences and a novel DFT technique for emerging failures due to process variations. מאת Qikai Chen

    הוצא לאור ב IEEE Transactions on VLSI systems
    Article

    Efficient testing of SRAM with optimized march sequences and a novel DFT technique for emerging failures due to process variations.
  10. 2210

    Design of a 1.7-GHz low-power delay-fault-testable 32-b ALU in 180-nm CMOS technology. מאת Chatterjee, B.

    הוצא לאור ב IEEE Transactions on VLSI systems
    Article

    Design of a 1.7-GHz low-power delay-fault-testable 32-b ALU in 180-nm CMOS technology.

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