-
6751
-
6752
Design-for-testability for embedded delay-locked loops.
Published in IEEE Transactions on VLSI systemsArticle -
6753
-
6754
-
6755
The development of an achievement test in beginning Spanish
Published in Education quarterly.Article -
6756
-
6757
-
6758
Diagnostic reading tests, forms C and D, grade 4 through grade 12
Published in Education quarterly.Article -
6759
Statistical formulations in the constructions of DRT forms C & D
Published in Education quarterly.Article -
6760