Showing 6,661 - 6,670 results of 6,895 for search '"Tests"', query time: 0.04s Refine Results
  1. 6661

    Improving the stuck-at fault coverage of functional test sequences by using limited-scan operations. by Pomeranz, I.

    Article

    Improving the stuck-at fault coverage of functional test sequences by using limited-scan operations.
  2. 6662

    Linear prediction based packet loss concealment algorithm for PCM coded speech. by Gunduzhan, E.

    Article

    Linear prediction based packet loss concealment algorithm for PCM coded speech.
  3. 6663

    Substrate coupling in digital circuits in mixed-signal smart-power systems. by Secareanu, R.M

    Article

    Substrate coupling in digital circuits in mixed-signal smart-power systems.
  4. 6664

    A jitter characterization system using a component-invariant Vernier delay line. by Chan, A.H

    Article

    A jitter characterization system using a component-invariant Vernier delay line.
  5. 6665

    An adaptive KLT approach for speech enhancement. by Rezayee, A.

    Article

    An adaptive KLT approach for speech enhancement.
  6. 6666

    Doc at a Distance. by Rosen, J.

    Published in IEEE spectrum
    Article

    Doc at a Distance.
  7. 6667

    Applying the harmonic plus noise model in concatenative speech synthesis. by Stylianou, Y.

    Article

    Applying the harmonic plus noise model in concatenative speech synthesis.
  8. 6668

    Test pattern generation and partial-scan methodology for an asynchronous SoC interconnect. by Efthymiou, A.

    Article

    Test pattern generation and partial-scan methodology for an asynchronous SoC interconnect.
  9. 6669

    Modular and rapid testing of SOCs with unwrapped logic blocks. by Qiang Xu

    Article

    Modular and rapid testing of SOCs with unwrapped logic blocks.
  10. 6670

    Efficient testing of SRAM with optimized march sequences and a novel DFT technique for emerging failures due to process variations. by Qikai Chen

    Article

    Efficient testing of SRAM with optimized march sequences and a novel DFT technique for emerging failures due to process variations.

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