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6671
Design of a 1.7-GHz low-power delay-fault-testable 32-b ALU in 180-nm CMOS technology.
Argitaratua izan da IEEE Transactions on VLSI systemsArtikulua -
6672
-
6673
Function-based compact test pattern generation for path delay faults.
Argitaratua izan da IEEE Transactions on VLSI systemsArtikulua -
6674
-
6675
-
6676
-
6677
-
6678
-
6679
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6680