Résultat(s) 6 661 - 6 670 résultats de 6 895 pour la requête '"Testing."', Temps de recherche: 0,04s Affiner les résultats
  1. 6661

    Improving the stuck-at fault coverage of functional test sequences by using limited-scan operations. par Pomeranz, I.

    Article

    Improving the stuck-at fault coverage of functional test sequences by using limited-scan operations.
  2. 6662

    Linear prediction based packet loss concealment algorithm for PCM coded speech. par Gunduzhan, E.

    Article

    Linear prediction based packet loss concealment algorithm for PCM coded speech.
  3. 6663

    Substrate coupling in digital circuits in mixed-signal smart-power systems. par Secareanu, R.M

    Article

    Substrate coupling in digital circuits in mixed-signal smart-power systems.
  4. 6664

    A jitter characterization system using a component-invariant Vernier delay line. par Chan, A.H

    Article

    A jitter characterization system using a component-invariant Vernier delay line.
  5. 6665

    An adaptive KLT approach for speech enhancement. par Rezayee, A.

    Article

    An adaptive KLT approach for speech enhancement.
  6. 6666

    Doc at a Distance. par Rosen, J.

    Publié dans IEEE spectrum
    Article

    Doc at a Distance.
  7. 6667

    Applying the harmonic plus noise model in concatenative speech synthesis. par Stylianou, Y.

    Article

    Applying the harmonic plus noise model in concatenative speech synthesis.
  8. 6668

    Test pattern generation and partial-scan methodology for an asynchronous SoC interconnect. par Efthymiou, A.

    Article

    Test pattern generation and partial-scan methodology for an asynchronous SoC interconnect.
  9. 6669

    Modular and rapid testing of SOCs with unwrapped logic blocks. par Qiang Xu

    Article

    Modular and rapid testing of SOCs with unwrapped logic blocks.
  10. 6670

    Efficient testing of SRAM with optimized march sequences and a novel DFT technique for emerging failures due to process variations. par Qikai Chen

    Article

    Efficient testing of SRAM with optimized march sequences and a novel DFT technique for emerging failures due to process variations.

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