Treffer 6.091 - 6.100 von 6.895 für Suche '"Testing."', Suchdauer: 0,04s Treffer weiter einschränken
  1. 6091

    A shaped reflector antenna for 60-GHz radio access points. von Smulders, P.F.M

    Artikel

    A shaped reflector antenna for 60-GHz radio access points.
  2. 6092

    Adaptive transient solution of nonuniform multiconductor transmission lines using wavelets. von Grivet-Talocia, S.

    Artikel

    Adaptive transient solution of nonuniform multiconductor transmission lines using wavelets.
  3. 6093

    Diffraction by an anisotropic dielectric half-plane a uniform asymptotic PO solution. von Gennarelli, C.

    Artikel

    Diffraction by an anisotropic dielectric half-plane a uniform asymptotic PO solution.
  4. 6094

    Electromagnetic induction and surface impedance in a half-space from an overhead moving current system. von Hsueh-Yuan Pao

    Artikel

    Electromagnetic induction and surface impedance in a half-space from an overhead moving current system.
  5. 6095

    A viable model for power focusing in a lossy cylinder. von Nabulsi, K.A

    Artikel

    A viable model for power focusing in a lossy cylinder.
  6. 6096

    Sensitivity limitation of a SQUID gravity gradiometer due to elastic interaction between sensing currents and test masses. von Zarembinski, S.

    Artikel

    Sensitivity limitation of a SQUID gravity gradiometer due to elastic interaction between sensing currents and test masses.
  7. 6097

    Room-temperature testing for high critical-current-density Josephson junctions. von O'Hara, M.J

    Artikel

    Room-temperature testing for high critical-current-density Josephson junctions.
  8. 6098

    Reverse-order-restoration-based static test compaction for synchronous sequential circuits. von Ruifeng Guo

    Artikel

    Reverse-order-restoration-based static test compaction for synchronous sequential circuits.
  9. 6099

    Exact path delay fault coverage with fundamental ZBDD operations. von Padmanaban, S.

    Artikel

    Exact path delay fault coverage with fundamental ZBDD operations.
  10. 6100

    A unified approach to reduce SOC test data volume, scan power and testing time. von Chandra, A.

    Artikel

    A unified approach to reduce SOC test data volume, scan power and testing time.

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