Mostrando 1 - 5 resultados de 5 para a busca '"Test-application time."', tempo de busca: 0.02s Refinar Resultados
  1. 1

    A unified approach to reduce SOC test data volume, scan power and testing time. por Chandra, A.

    Artigo

    A unified approach to reduce SOC test data volume, scan power and testing time.
  2. 2

    Test pattern generation and clock disabling for simultaneous test time and power reduction. por Jih-Jeen Chen

    Artigo

    Test pattern generation and clock disabling for simultaneous test time and power reduction.
  3. 3

    Nine-coded compression technique for testing embedded cores in SoCs. por Tehranipoor, M.

    Artigo

    Nine-coded compression technique for testing embedded cores in SoCs.
  4. 4

    Testing ASICs with multiple identical cores. por Yuejian Wu

    Artigo

    Testing ASICs with multiple identical cores.
  5. 5

    Testing of core-based systems-on-a-chip. por Ravi, S.

    Artigo

    Testing of core-based systems-on-a-chip.

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