Visas 1 - 5 av 5 resultat för sökning '"Test-application time."', Sökningstid: 0,02s Förfina resultatet
  1. 1

    A unified approach to reduce SOC test data volume, scan power and testing time. av Chandra, A.

    Artikel

    A unified approach to reduce SOC test data volume, scan power and testing time.
  2. 2

    Test pattern generation and clock disabling for simultaneous test time and power reduction. av Jih-Jeen Chen

    Artikel

    Test pattern generation and clock disabling for simultaneous test time and power reduction.
  3. 3

    Nine-coded compression technique for testing embedded cores in SoCs. av Tehranipoor, M.

    Artikel

    Nine-coded compression technique for testing embedded cores in SoCs.
  4. 4

    Testing ASICs with multiple identical cores. av Yuejian Wu

    Artikel

    Testing ASICs with multiple identical cores.
  5. 5

    Testing of core-based systems-on-a-chip. av Ravi, S.

    Artikel

    Testing of core-based systems-on-a-chip.

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