Showing 1 - 5 results of 5 for search '"Test-application time."', सवाल का समय: 0.02सेकंड परिणाम को परिष्कृत करें
  1. 1

    A unified approach to reduce SOC test data volume, scan power and testing time. द्वारा Chandra, A.

    लेख

    A unified approach to reduce SOC test data volume, scan power and testing time.
  2. 2

    Test pattern generation and clock disabling for simultaneous test time and power reduction. द्वारा Jih-Jeen Chen

    लेख

    Test pattern generation and clock disabling for simultaneous test time and power reduction.
  3. 3

    Nine-coded compression technique for testing embedded cores in SoCs. द्वारा Tehranipoor, M.

    में प्रकाशित IEEE Transactions on VLSI systems
    लेख

    Nine-coded compression technique for testing embedded cores in SoCs.
  4. 4

    Testing ASICs with multiple identical cores. द्वारा Yuejian Wu

    लेख

    Testing ASICs with multiple identical cores.
  5. 5

    Testing of core-based systems-on-a-chip. द्वारा Ravi, S.

    लेख

    Testing of core-based systems-on-a-chip.

खोज साधन: