Risultati della ricerca - "Test generation."

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  1. 1

    Test enrichment for path delay faults using multiple sets of target faults. di Pomeranz, I.

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  2. 2

    Autoscan a scan design without external scan inputs or outputs. di Pomeranz, I.

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  3. 3

    A test generation strategy for pairwise testing. di Kuo-Chung Tai

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  4. 4

    Function-based compact test pattern generation for path delay faults. di Michael, M.K

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  5. 5

    Testing ASICs with multiple identical cores. di Yuejian Wu

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  6. 6

    Generating optimal distinguishing sequences with a model checker. di Robinson-Mallett, Christopher

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  7. 7

    Software-based self-testing methodology for processor cores. di Li Chen

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  8. 8

    Accumulator-based test generation for robust sequential fault testing in DSP cores in near-optimal time. di Voyiatzis, I.

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  9. 9

    Automatic test pattern generation for functional register-transfer level circuits using assignment decision diagrams. di Ghosh, I.

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