Mostrando 1 - 6 resultados de 6 para a busca '"Test data compression."', tempo de busca: 0.02s Refinar Resultados
  1. 1

    A unified approach to reduce SOC test data volume, scan power and testing time. por Chandra, A.

    Artigo

    A unified approach to reduce SOC test data volume, scan power and testing time.
  2. 2

    Synchronization overhead in SOC compressed test. por Gonciari, P.T

    Artigo

    Synchronization overhead in SOC compressed test.
  3. 3

    Weighted pseudorandom hybrid BIST. por Jas, A.

    Artigo

    Weighted pseudorandom hybrid BIST.
  4. 4

    Test slice difference technique for low-transition test data compression. por Rau, Jiann-Chyi

    Artigo

    Test slice difference technique for low-transition test data compression.
  5. 5

    Nine-coded compression technique for testing embedded cores in SoCs. por Tehranipoor, M.

    Artigo

    Nine-coded compression technique for testing embedded cores in SoCs.
  6. 6

    Test data compression technique for embedded cores using virtual scan chains. por Jas, A.

    Artigo

    Test data compression technique for embedded cores using virtual scan chains.

Ferramentas de busca: