Toon 1 - 7 resultaten van 7 Voor zoekopdracht '"Test application."', zoektijd: 0,02s Verfijn jouw resultaten
  1. 1

    A unified approach to reduce SOC test data volume, scan power and testing time. door Chandra, A.

    Artikel

    A unified approach to reduce SOC test data volume, scan power and testing time.
  2. 2

    Test pattern generation and clock disabling for simultaneous test time and power reduction. door Jih-Jeen Chen

    Artikel

    Test pattern generation and clock disabling for simultaneous test time and power reduction.
  3. 3

    Nine-coded compression technique for testing embedded cores in SoCs. door Tehranipoor, M.

    Artikel

    Nine-coded compression technique for testing embedded cores in SoCs.
  4. 4

    Testing ASICs with multiple identical cores. door Yuejian Wu

    Artikel

    Testing ASICs with multiple identical cores.
  5. 5

    On the use of random limited-scan to improve at-speed random pattern testing of scan circuits. door Pomeranz, I.

    Artikel

    On the use of random limited-scan to improve at-speed random pattern testing of scan circuits.
  6. 6

    Software-based self-testing methodology for processor cores. door Li Chen

    Artikel

    Software-based self-testing methodology for processor cores.
  7. 7

    Testing of core-based systems-on-a-chip. door Ravi, S.

    Artikel

    Testing of core-based systems-on-a-chip.

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