Mostrar 1 - 5 resultats de 5 per cerca '"Test application time."', hora de la petició: 0.02sec Refinar resultats
  1. 1

    A unified approach to reduce SOC test data volume, scan power and testing time. per Chandra, A.

    Article

    A unified approach to reduce SOC test data volume, scan power and testing time.
  2. 2

    Test pattern generation and clock disabling for simultaneous test time and power reduction. per Jih-Jeen Chen

    Article

    Test pattern generation and clock disabling for simultaneous test time and power reduction.
  3. 3

    Nine-coded compression technique for testing embedded cores in SoCs. per Tehranipoor, M.

    Article

    Nine-coded compression technique for testing embedded cores in SoCs.
  4. 4

    Testing ASICs with multiple identical cores. per Yuejian Wu

    Article

    Testing ASICs with multiple identical cores.
  5. 5

    Testing of core-based systems-on-a-chip. per Ravi, S.

    Article

    Testing of core-based systems-on-a-chip.

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