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12611
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12612
A new maximal diagnosis algorithm for interconnect test.
Pubblicato in IEEE Transactions on VLSI systemsArticolo -
12613
A low-power reduced swing global clocking methodology.
Pubblicato in IEEE Transactions on VLSI systemsArticolo -
12614
Scaling trends of on-chip power distribution noise.
Pubblicato in IEEE Transactions on VLSI systemsArticolo -
12615
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12616
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12617
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12618
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12619
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12620