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20041
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20042
A robust self-calibrating transmission scheme for on-chip networks.
I publikationen IEEE Transactions on VLSI systemsArtikel -
20043
Synchronization overhead in SOC compressed test.
I publikationen IEEE Transactions on VLSI systemsArtikel -
20044
VLSI implementation of new arithmetic residue to binary decoders.
I publikationen IEEE Transactions on VLSI systemsArtikel -
20045
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20046
SOC test planning using virtual test access architectures.
I publikationen IEEE Transactions on VLSI systemsArtikel -
20047
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20048
-
20049
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20050