Erakusten 11 - 20 emaitzak -- 25 bilaketa honetara '"Statistical Process Control."', Bilaketaren denbora: 0,03s Findu emaitzak
  1. 11

    Monitoring batch processes with multiple on-off steps in semiconductor manufacturing. nork Lee, Shui-Pin

    Argitaratua izan da Journal of Quality Technology
    Artikulua

    Monitoring batch processes with multiple on-off steps in semiconductor manufacturing.
  2. 12

    Estimating the standard deviation in quality control applications. nork Mahmoud, Mahmoud A.

    Argitaratua izan da Journal of Quality Technology
    Artikulua

    Estimating the standard deviation in quality control applications.
  3. 13

    A distribution-free phase I control chart for subgroup scale. nork Jones-Farmer, L. Allison

    Argitaratua izan da Journal of Quality Technology
    Artikulua

    A distribution-free phase I control chart for subgroup scale.
  4. 14

    EWMA charts for the Weibull Shape Parameter. nork Pascual, Francis

    Argitaratua izan da Journal of Quality Technology
    Artikulua

    EWMA charts for the Weibull Shape Parameter.
  5. 15

    A variable selection based multivariate EWMA chart for process monitoring and diagnosis. nork Jiang, Wei

    Argitaratua izan da Journal of Quality Technology
    Artikulua

    A variable selection based multivariate EWMA chart for process monitoring and diagnosis.
  6. 16

    Adaptive generalized likelihood ratio control charts for detecting unknown patterned mean shifts. nork Capizzi, Giovanna

    Argitaratua izan da Journal of Quality Technology
    Artikulua

    Adaptive generalized likelihood ratio control charts for detecting unknown patterned mean shifts.
  7. 17

    Maximum likelihood-based diagnostics after a signal from control charts. nork Lou, Jianying

    Argitaratua izan da Journal of Quality Technology
    Artikulua

    Maximum likelihood-based diagnostics after a signal from control charts.
  8. 18

    The monitoring of linear profiles with a GLR control chart. nork Xu, Liaosa

    Argitaratua izan da Journal of Quality Technology
    Artikulua

    The monitoring of linear profiles with a GLR control chart.
  9. 19

    T2 control charts with variable dimension. nork Aparisi, Francisco

    Argitaratua izan da Journal of Quality Technology
    Artikulua

    T2 control charts with variable dimension.
  10. 20

    The Difficulty in designing Shewhart X and X control charts with estimated parameters nork Saleh, Nesma A

    Argitaratua izan da Journal of quality technology
    Artikulua

    The Difficulty in designing Shewhart X and X control charts with estimated parameters

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