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221
Hot-hole-induced dielectric breakdown in LDMOS transistors.
Argitaratua izan da IEEE Transactions on electron devicesArtikulua -
222
Threshold voltage-related soft error degradation in a TFT SRAM cell.
Argitaratua izan da IEEE Transactions on electron devicesArtikulua -
223
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224
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225
Analysis of grounding systems for electric traction.
Argitaratua izan da IEEE Transactions on power deliveryArtikulua -
226
Steady state frequency response of STATCOM.
Argitaratua izan da IEEE Transactions on power deliveryArtikulua -
227
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228
A constrained modulus reconstruction technique for breast cancer assessment.
Argitaratua izan da IEEE Transactions on medical imagingArtikulua -
229
Physics-based MCT circuit model using the lumped-charge modeling approach.
Argitaratua izan da IEEE Transactions on power electronicsArtikulua -
230