RF and microwave modeling and measurement techniques for compound field effect transistors מאת Gao, Jianjun 1968-

Available for University of the Philippines Diliman via IET Digital Library. Click here to access
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Integrated circuit failure analysis a guide to preparation techniques מאת Beck, Friedrich

Recombination lifetime measurements in silicon.

Recombination lifetime measurements in silicon

Integrated circuit failure analysis a guide to preparation techniques מאת Beck, Friedrich

Principles of semiconductor network testing מאת Afshar, Amir

Electron beam testing technology

Optical characterization of semiconductors infrared, raman, and photoluminescence spectroscopy מאת Perkowitz, S.

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Semiconductor material and device characterization מאת Schroder, Dieter K.

Semiconductor material and device characterization מאת Schroder, Dieter K.