Résultats de la recherche - "Semiconductors Testing"

Integrated circuit failure analysis a guide to preparation techniques par Beck, Friedrich

Semiconductor material and device characterization par Schroder, Dieter K.

Semiconductor material and device characterization par Schroder, Dieter K.

Integrated circuit failure analysis a guide to preparation techniques par Beck, Friedrich

Electrical characterization of GaAs materials and devices par Look, D. C. (David C.) 1938-

Principles of semiconductor network testing par Afshar, Amir

Optical characterization of semiconductors infrared, raman, and photoluminescence spectroscopy par Perkowitz, S.

Available for University of the Philippines System via ScienceDirect. Click here to access
Also available remotely for University of the Philippines System via ScienceDirect. Click here to access thru EZproxy

Electron beam testing technology

Recombination lifetime measurements in silicon.

Recombination lifetime measurements in silicon