Erakusten 1 - 4 emaitzak -- 4 bilaketa honetara '"Scan testing."', Bilaketaren denbora: 0,01s Findu emaitzak
  1. 1

    The boundary-scan handbook nork Parker, Kenneth P.

    Argitaratua 2016
    Available for University of the Philippines System via SpringerLink. Click here to access
    Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy
    Electronic Resource

    The boundary-scan handbook
  2. 2

    The Test access port and boundary scan architecture

    Argitaratua 1990
    Liburua

    The Test access port and boundary scan architecture
  3. 3

    A unified approach to reduce SOC test data volume, scan power and testing time. nork Chandra, A.

    Artikulua

    A unified approach to reduce SOC test data volume, scan power and testing time.
  4. 4

    Test pattern generation and partial-scan methodology for an asynchronous SoC interconnect. nork Efthymiou, A.

    Argitaratua izan da IEEE Transactions on VLSI systems
    Artikulua

    Test pattern generation and partial-scan methodology for an asynchronous SoC interconnect.

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