يعرض 1 - 4 نتائج من 4 نتيجة بحث عن '"Scan testing."', وقت الاستعلام: 0.02s تنقيح النتائج
  1. 1

    The boundary-scan handbook حسب Parker, Kenneth P.

    منشور في 2016
    Available for University of the Philippines System via SpringerLink. Click here to access
    Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy
    Electronic Resource

    The boundary-scan handbook
  2. 2

    The Test access port and boundary scan architecture

    منشور في 1990
    كتاب

    The Test access port and boundary scan architecture
  3. 3

    A unified approach to reduce SOC test data volume, scan power and testing time. حسب Chandra, A.

    مقال

    A unified approach to reduce SOC test data volume, scan power and testing time.
  4. 4

    Test pattern generation and partial-scan methodology for an asynchronous SoC interconnect. حسب Efthymiou, A.

    الحاوية / القاعدة IEEE Transactions on VLSI systems
    مقال

    Test pattern generation and partial-scan methodology for an asynchronous SoC interconnect.

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