Отображение 1 - 2 результаты of 2 для поиска '"Scan operations."', время запроса: 0.01сек. Отмена результатов
  1. 1

    Improving the stuck-at fault coverage of functional test sequences by using limited-scan operations. по Pomeranz, I.

    Опубликовано в: IEEE Transactions on VLSI systems
    Статья

    Improving the stuck-at fault coverage of functional test sequences by using limited-scan operations.
  2. 2

    On the use of random limited-scan to improve at-speed random pattern testing of scan circuits. по Pomeranz, I.

    Статья

    On the use of random limited-scan to improve at-speed random pattern testing of scan circuits.

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