Showing 11 - 20 results of 27 for search '"SRAM."', query time: 0.02s Refine Results
  1. 11

    A low leakage SRAM macro with replica cell biasing scheme. by Takeyama, Y.

    Article

    A low leakage SRAM macro with replica cell biasing scheme.
  2. 12

    An autonomous SRAM with on-chip sensors in an 80-nm double stacked cell technology. by Sohn, K.

    Article

    An autonomous SRAM with on-chip sensors in an 80-nm double stacked cell technology.
  3. 13

    A Leakage Current Replica Keeper for Dynamic Circuits. by Lih, Y.

    Article

    A Leakage Current Replica Keeper for Dynamic Circuits.
  4. 14

    An Organic FET SRAM With Back Gate to Increase Static Noise Margin and Its Application to Braille Sheet Display. by Takamiya, M.

    Article

    An Organic FET SRAM With Back Gate to Increase Static Noise Margin and Its Application to Braille Sheet Display.
  5. 15

    A 90-nm CMOS Low-Power GSM by Lueftner, T.

    Article

    A 90-nm CMOS Low-Power GSM
  6. 16

    A 160K Gates by Lin, C.-C

    Article

    A 160K Gates
  7. 17

    The Design and Implementation of the Massively Parallel Processor Based on the Matrix Architecture. by Noda, H.

    Article

    The Design and Implementation of the Massively Parallel Processor Based on the Matrix Architecture.
  8. 18

    A 256-Kb Dual-VCC SRAM Building Block in 65-nm CMOS Process With Actively Clamped Sleep Transistor. by Khellah, M.

    Article

    A 256-Kb Dual-VCC SRAM Building Block in 65-nm CMOS Process With Actively Clamped Sleep Transistor.
  9. 19

    A forward body-biased low-leakage SRAM cache device, circuit and architecture considerations. by Kim, C.H

    Article

    A forward body-biased low-leakage SRAM cache device, circuit and architecture considerations.
  10. 20

    Efficient testing of SRAM with optimized march sequences and a novel DFT technique for emerging failures due to process variations. by Qikai Chen

    Article

    Efficient testing of SRAM with optimized march sequences and a novel DFT technique for emerging failures due to process variations.

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