Erakusten 1 - 3 emaitzak -- 3 bilaketa honetara '"Run length codes."', Bilaketaren denbora: 0,02s Findu emaitzak
  1. 1

    A unified approach to reduce SOC test data volume, scan power and testing time. nork Chandra, A.

    Artikulua

    A unified approach to reduce SOC test data volume, scan power and testing time.
  2. 2

    Hadamard-based image decomposition and compression. nork Valova, I.

    Artikulua

    Hadamard-based image decomposition and compression.
  3. 3

    Nine-coded compression technique for testing embedded cores in SoCs. nork Tehranipoor, M.

    Argitaratua izan da IEEE Transactions on VLSI systems
    Artikulua

    Nine-coded compression technique for testing embedded cores in SoCs.

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