Treffer 771 - 780 von 796 für Suche '"Reliability."', Suchdauer: 0,02s Treffer weiter einschränken
  1. 771

    Neglect testing at your peril. von O'Connor, P.D.T

    Veröffentlicht in IEEE spectrum
    Artikel

    Neglect testing at your peril.
  2. 772

    Delay and synchronization control middleware to support real-time multimedia services over wireless PCS networks. von Hang Liu

    Artikel

    Delay and synchronization control middleware to support real-time multimedia services over wireless PCS networks.
  3. 773

    Can you trust your car? [automotive electronics reliability testing]. von Berger, I.

    Veröffentlicht in IEEE spectrum
    Artikel

    Can you trust your car? [automotive electronics reliability testing].
  4. 774

    Keeping the lights on [power system reliability]. von Mountford, J.D

    Veröffentlicht in IEEE spectrum
    Artikel

    Keeping the lights on [power system reliability].
  5. 775

    Tubes still vital after all these years. von Symons, R.S

    Veröffentlicht in IEEE spectrum
    Artikel

    Tubes still vital after all these years.
  6. 776

    A novel energy efficient SFCL with a silver-free contact switchgear for application in electricity and transportation. von Mamalis, A.G

    Artikel

    A novel energy efficient SFCL with a silver-free contact switchgear for application in electricity and transportation.
  7. 777

    The design and performance of a neural network for predicting turbo decoding error with application to hybrid ARQ protocols. von Buckley, M.E

    Artikel

    The design and performance of a neural network for predicting turbo decoding error with application to hybrid ARQ protocols.
  8. 778

    Minimum buffered routing with bounded capacitive load for slew rate and reliability control. von Alpert, C.J

    Artikel

    Minimum buffered routing with bounded capacitive load for slew rate and reliability control.
  9. 779

    Continuous error detection (CED) for reliable communication. von Anand, R.

    Artikel

    Continuous error detection (CED) for reliable communication.
  10. 780

    Chip-level charged-device modeling and simulation in CMOS integrated circuits. von Jaesik Lee

    Artikel

    Chip-level charged-device modeling and simulation in CMOS integrated circuits.

Suchwerkzeuge: