Отображение 1 - 7 результаты of 7 для поиска '"Process variation."', время запроса: 0.02сек. Отмена результатов
  1. 1

    Simultaneous Vt selection and assignment for leakage optimization. по Khandelwal, V.

    Опубликовано в: IEEE Transactions on VLSI systems
    Статья

    Simultaneous Vt selection and assignment for leakage optimization.
  2. 2

    An efficient merging scheme for prescribed skew clock routing. по Chaturvedi, R.

    Опубликовано в: IEEE Transactions on VLSI systems
    Статья

    An efficient merging scheme for prescribed skew clock routing.
  3. 3

    Self-reset logic for fast arithmetic applications. по Litvin, M.E

    Опубликовано в: IEEE Transactions on VLSI systems
    Статья

    Self-reset logic for fast arithmetic applications.
  4. 4

    A novel wavelet transform-based transient current analysis for fault detection and localization. по Bhunia, S.

    Опубликовано в: IEEE Transactions on VLSI systems
    Статья

    A novel wavelet transform-based transient current analysis for fault detection and localization.
  5. 5

    Efficient testing of SRAM with optimized march sequences and a novel DFT technique for emerging failures due to process variations. по Qikai Chen

    Опубликовано в: IEEE Transactions on VLSI systems
    Статья

    Efficient testing of SRAM with optimized march sequences and a novel DFT technique for emerging failures due to process variations.
  6. 6

    Path delay fault diagnosis and coverage-a metric and an estimation technique. по Sivaraman, M.

    Статья

    Path delay fault diagnosis and coverage-a metric and an estimation technique.
  7. 7

    Block-based multiperiod dynamic memory design for low data-retention power. по Joohee Kim

    Опубликовано в: IEEE Transactions on VLSI systems
    Статья

    Block-based multiperiod dynamic memory design for low data-retention power.

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