Εμφανίζονται 8.301 - 8.310 Αποτελέσματα από 8.437 για την αναζήτηση '"Problems."', χρόνος αναζήτησης: 0,05δλ Περιορισμός αποτελεσμάτων
  1. 8301

    Per tone equalization for DMT-based systems. ανά Van Acker, K.

    Τόπος έκδοσης IEEE Transactions on communications
    Άρθρο

    Per tone equalization for DMT-based systems.
  2. 8302

    Constrained maximum-likelihood detection in CDMA. ανά Peng Hui Tan

    Τόπος έκδοσης IEEE Transactions on communications
    Άρθρο

    Constrained maximum-likelihood detection in CDMA.
  3. 8303

    Blind adaptive algorithms for minimum variance CDMA receivers. ανά Zhengyuan Xu

    Τόπος έκδοσης IEEE Transactions on communications
    Άρθρο

    Blind adaptive algorithms for minimum variance CDMA receivers.
  4. 8304

    On the performance of iterative noncoherent detection of coded M-PSK signals. ανά Marsland, I.D

    Τόπος έκδοσης IEEE Transactions on communications
    Άρθρο

    On the performance of iterative noncoherent detection of coded M-PSK signals.
  5. 8305

    Minimum buffered routing with bounded capacitive load for slew rate and reliability control. ανά Alpert, C.J

    Άρθρο

    Minimum buffered routing with bounded capacitive load for slew rate and reliability control.
  6. 8306

    Layout driven synthesis of multiple scan chains. ανά Rahimi, K.

    Άρθρο

    Layout driven synthesis of multiple scan chains.
  7. 8307

    Maze routing with buffer insertion under transition time constraints. ανά Li-Da Huang

    Άρθρο

    Maze routing with buffer insertion under transition time constraints.
  8. 8308

    Formulating SoC test scheduling as a network transportation problem. ανά Koranne, S.

    Άρθρο

    Formulating SoC test scheduling as a network transportation problem.
  9. 8309

    On the nonenumerative path delay fault simulation problem. ανά Kagaris, D.

    Άρθρο

    On the nonenumerative path delay fault simulation problem.
  10. 8310

    Handling the pin overhead problem of DFTs for high-quality and at-speed tests. ανά Dong Xiang

    Άρθρο

    Handling the pin overhead problem of DFTs for high-quality and at-speed tests.

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