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A fuzzy model for path delay fault detection.
Argitaratua izan da IEEE Transactions on VLSI systemsArtikulua -
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Function-based compact test pattern generation for path delay faults.
Argitaratua izan da IEEE Transactions on VLSI systemsArtikulua -
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Implicit deductive fault simulation for complex delay fault models.
Argitaratua izan da IEEE Transactions on VLSI systemsArtikulua