Showing
1 - 1
results of
1
for search '
"On-chip measurement."
'
Skip to content
UPFind
Book Bag:
0
items
(Full)
Language
English
Deutsch
Español
Français
Italiano
日本語
Nederlands
Português
Português (Brasil)
中文(简体)
中文（繁體）
Türkçe
עברית
Gaeilge
Cymraeg
Ελληνικά
Català
Euskara
Русский
Čeština
Suomi
Svenska
polski
Dansk
slovenščina
اللغة العربية
বাংলা
Galego
Tiếng Việt
Hrvatski
हिंदी
All Fields
Title
Author
Subject
Call Number
ISBN/ISSN
Find
Advanced
Search Results - "On-chip measurement."
Showing
1 - 1
results of
1
for search '
"On-chip measurement."
'
, query time: 0.02s
Refine Results
Sort
Relevance
Newest to Oldest
Oldest to Newest
Author
Title
Select Page
Email
Export
Print
Add to Book Bag
Select result number 1
1
A test circuit for measurement of clocked storage element characteristics.
by
Nedovic, N.
Published in
IEEE Journal of solid state circuits
Call Number:
loading...
Located:
loading...
Article
loading...
Add to Book Bag
Remove from Book Bag
Select Page
Email
Export
Print
Add to Book Bag
Search Tools:
Email Search
Back
Refine Results
Page will reload when a filter is selected or excluded.
DATABASE
Union Catalog (Buklod)
1 results
1
AUTHOR
Nedovic, N.
1 results
1
RESOURCE TYPE
Article
1 results
1
LANGUAGE
English
1 results
1
TUKLAS
: UP Libraries' Resource Discovery Tool
Copyright © 2020-2021. The University Library, University of the Philippines Diliman