يعرض 931 - 940 نتائج من 1,209 نتيجة بحث عن '"Memory"', وقت الاستعلام: 0.02s تنقيح النتائج
  1. 931

    Adding error-correcting circuitry to ASIC memory. حسب Gray, K.

    الحاوية / القاعدة IEEE spectrum
    مقال

    Adding error-correcting circuitry to ASIC memory.
  2. 932

    Magnetoelectronic memories last and last. حسب Johnson, M.

    الحاوية / القاعدة IEEE spectrum
    مقال

    Magnetoelectronic memories last and last.
  3. 933

    Embedded DRAM technology opportunities and challenges. حسب Iyer, S.S

    الحاوية / القاعدة IEEE spectrum
    مقال

    Embedded DRAM technology opportunities and challenges.
  4. 934

    Synthesis of Cu-Zn-Al shape memory alloy via electrodeposition on aluminum substrate حسب Almadrones, Emma Lorica

    أطروحة

    Synthesis of Cu-Zn-Al shape memory alloy via electrodeposition on aluminum substrate
  5. 935

    Operation power boost. حسب Simon, Michael

    الحاوية / القاعدة Mac life
    مقال

    Operation power boost.
  6. 936

    FIR channel-shortening equalizers for MIMO ISI channels. حسب Al-Dhahir, N.

    الحاوية / القاعدة IEEE Transactions on communications
    مقال

    FIR channel-shortening equalizers for MIMO ISI channels.
  7. 937

    Simulation of arsenic in situ doping with polysilicon CVD and its application to high aspect ratio trenches. حسب Heitzinger, C.

    مقال

    Simulation of arsenic in situ doping with polysilicon CVD and its application to high aspect ratio trenches.
  8. 938

    Analysis of a full-memory multidestination ARQ protocol over broadcast links. حسب Jianhua He

    الحاوية / القاعدة IEEE Transactions on communications
    مقال

    Analysis of a full-memory multidestination ARQ protocol over broadcast links.
  9. 939

    A framework for testing special-purpose memories. حسب Sidorowicz, P.R

    مقال

    A framework for testing special-purpose memories.
  10. 940

    Threshold voltage-related soft error degradation in a TFT SRAM cell. حسب Ikeda, S.

    الحاوية / القاعدة IEEE Transactions on electron devices
    مقال

    Threshold voltage-related soft error degradation in a TFT SRAM cell.

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